Points of View
More Engineering Research
HFS Highlight: Powered by Google Cloud, TCS introduces WaferWise to detect wafer anomaly in semiconductor manufacturing
Semiconductor manufacturers rely heavily on human expertise for wafer anomaly detection increasing the possibility of errors and limiting manufacturing throughput. TCS recently launched TCS WaferWise, a Google cloud-based wafer anomaly detection solution for semiconductor manufacturing that automatically detects defects, improves product quality, increases throughput, and enhances business growth.
Sign in or register an account to access HFS' Content
Create an account